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MATERIAL TESTING - NANO > PARK SYSTEMS - AFM
   

Park Systems -AFM

Park Systems is a leading nanotechnology solutions partner for the most demanding imaging and measurement needs in research and industry.

Park Systems serves its customers worldwide with advanced atomic force microscopes and global service and support with direct offices in Korea, Japan, Singapore, and the United States. For over 25 years, Park Systems has developed a reputation as the AFM technology leader and preferred nanotechnology solutions partner for demanding nanoscale research and

industrial measurements, among major universities, research institutes and industry leaders who demand the very best precision metrology solutions for the most challenging problems in their fields.
http://www.parkafm.com
  RESEARCH AFM   INDUSTRIAL AFM
XE-Bio
Non Contact In-liquid Imaging and Ion Conductance Microscopy
E-HDM
Automatic Defect Review AFM for Hard Disk Media and Substrates
XE-NSOM
For NSOM and Raman-AFM Measurements
XE-PTR
Automated Industrial AFM for Metrology of Read/Write Heads
XE-70
Affordable, Research-Grade AFM with Flexible Sample Handling
XE-WAFER
Automated Industrial AFM for In-line wafer Inspection and Metrology
XE-100
Award-Winning Research-Grade AFM with Step-and-Scan Automation

XE-3DM
Automated Industrial AFM for High-Resolution 3D Metrology

XE-120
For Combined Capability of XE-AFM and Inverted Optical Microscope
XE-LCD
Automated Industrial AFM for In-line Flat Panel Inspection and Metrology
XE-150
Premier Cross-Functional AFM with Motorized Sample Stage

 

 

 

 

   

 

 
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